Overview
The smart card is a card with a built-in IC chip. These cards are known for their convenience and security and being used in many fields, such as finance/ID/communication/transit, etc. KTC is a KOLAS organization for ISO/IEC 7816, 14443, 10373-6 and other smart card areas. We conduct tests on the compliance of smart cards and other related systems, their durability, and security.
ePassport, readers, and other ID applications
- The compliance test for the ICAO standard
- ISO/IEC 10373-6(2001, 2011)-related tests
- ICAO durability test
- ePassport and reader aging test
- ePassport compatibility and BMT
Finance and transit card
- IC card quality certification test for Korea Financial Telecommunications & Clearings Institute
- K-Cash quality certification test
- E-currency and IC-card terminal quality certification test
- Korea Expressway Corporation Hi-Pass card quality certification test
- Mobile HI-Pass Card Quality Certification Test
Mobile NFC area
- NFC Forum 1st Wave certification test (Digital Protocol)
- NFC Forum 2nd Wave certification (RF/Analog, SNEP/LLCP)
- NFC Device Confomity Test(A/B/F)
- NFC Device environment test
- ETSI SWP/HCI Card and Terminal testing
EMV L1 Debugging test for certification
- EMV L1 PCD Digital Protocol/EMD testing
- EMV L1 PICC Digital Protocol testing
- EMV L1 PICC/PCD RF/Analog testing
International standard compliance test for smart card and reader
- ISO/IEC 7810/7816 Compliance test
- ISO/IEC 14443(1st, 2nd) Compliance test
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- ISO/IEC 10373 Smart card (ID) test
- · Part 1 : General characteristics tests
- · Part 2 : Cards with magnetic stripes
- · Part 3 : Integrated circuit(s) cards with contacts and related devices
- · Part 4 : Proximity cards (PICC/PCD)
Quality Assurance Tests
Card Body Tests
- Adhesion / Amplitude / Bending
- Thermal Cycling / Humidity / Dimensions
- Card warpage / Delamination / Dynamic torsion and bending stress
- Electrical resistance and impedance of contacts
- Electromagnetic fields / Embossing character
- Magentic stripe(MS) characteristics test(surface, wear, profile)
- Location of fontacts / Resistance to chemicals
- Static electricity / Surface profile of contacts
- Ultraviolet light / Vibration / X-ray test
Microcontroller Hardware Tests(EN 1292)
- Signal rise and fall times I/O contacts
- number of possible write/erase cycles in EEPROM/FLASH memory
- Vcc over and undervoltage tests
- Clock over and underfrequency tests
- Vcc/Reset/Clock current consumption
Visit the website of the responsible department
Click the button below to jump to the main webpage of the responsible department, where you can find the contact information of the officers in charge.
