Side Channel analysis and Fault Injection Vulnerablities test to Smartcard Operating System
Provide Side Channel Analysis test and Fault Injection test to security IC chip for smart card or SE(Secure Element).
- Side Channel Analysis vulnerabilities test: SPA, SEMA, DPA, CPA, DEMA, CEMA
- Fault Injection vulnerability test service: Glitch, EM FI, Single Laser FI, Dual Laser FI
Evaluation method
- To protect confidential information, the test is to be conducted with the products that require security functions.
- The test includes the non-invasive Side Channel analysis where the chip is analyzed without inflicting any damages and the semi-invasive analysis where a part of the exterior of the chip is damaged.
- Power analysis, electromagnetic analysis, electromagnetic Fault injection, and optical injection error tests are carried out.
An overview of our Evaluation services
Test environment
For the test targets (smart cards, electronic passports, embedded system, and IC chips, etc.), use dedicated vulnerability Evaluation equipment (electromagnetic Fault Injection equipment, or Side Channel power analysis equipment) to conduct the test.
A guide to the Evaluation service evaluation
Inquiry and Contact Information
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